00803na  a2200217   4500001001300000005001500013008004100028024002700069035002700096100001400123370004800137372005300185373001700238374005700255375001100312377002200323400001800345400001700363670013500380670007000515KAC2018J997620210719145333181011 b aznnnaabn          fa aaa      7 a00000004737288362isni  a(KISTI)ADPER00001428701 a김선권  c한국(국명)[韓國]0KSH20000101452nlsh  a전자 공학[電子工學]0KSH19980184202nlsh  a삼성전자  a연구원(연구자)[硏究員]0KSH19980377142nlsh  a남성  l한국어l영어1 aKim, Seongwon1 aKim, Sunkwon  aOptical failure analysis technique in deep submicron CMOS integrated circuits, (Institute of electronics engineers of Korea), 2011  a한국과학기술정보연구원u(KISTI)https://www.kisti.re.kr