학위논문
Stress and process dependent characterization and modeling of amorphous InGaZnO thin-film transistors
표제/저자사항 Stress and process dependent characterization and modeling of amorphous InGaZnO thin-film transistors / Jung Han Kang
발행사항 Seoul : Yonsei Univ., 2013
형태사항 x, 89 leaves : ill., charts ; 26 cm
주기사항 Thesis(Ph.D.) -- Graduate School, Yonsei Univ., Dept. of Electrical and Electronic Engineering, 2013
Bibliography: leaves 78-87
In English; summary in Korean
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