학위논문
A study on reliability and low frequency noise characteristics of CMOS and Si-based high-κ devices for analog and RF applications
표제/저자사항 A study on reliability and low frequency noise characteristics of CMOS and Si-based high-κ devices for analog and RF applications / Hyuk-min Kwon
발행사항 Daejeon : Chungnam National Univ., 2014
형태사항 xxiv, 255 p. : ill. ; 26 cm
주기사항 Thesis(Ph.D.) -- Graduate School, Chungnam National Univ., Semiconductors and Circuits/System, Dept. of Electronics, Radio Science & Engineering, and Information Communications Engineering, 2014
Includes bibliographies
In English; summary in Korean
분류기호 한국십진분류법-> 569.434듀이십진분류법-> 621.3815284
출처 국립중앙도서관 바로가기
담당부서 : 국가서지과 (02-590-6339)
위로