국가전거
저자 전거 검색
학위논문
Study on correlation between intrinsic point defects in ZnO film and electrical properties in bottom-gated polycrystalline ZnO thin film transistors
표제/저자사항
Study on correlation between intrinsic point defects in ZnO film and electrical properties in bottom-gated polycrystalline ZnO thin film transistors / Kwang-Seok Jeong
발행사항
Daejeon : Chungnam National University, 2015
형태사항
xv, 147 pages : illustrations ; 26 cm
주기사항
Adviser: Ga-Won Lee
Thesis(Ph.D.) -- Graduate School, Chungnam National University, Semiconductors and Circuits/System, Department of Electronics, Radio Science & Engineering, and Information Communications Engineering, 2015
Includes bibliographies
In English; summary in Korean
Thesis(Ph.D.) -- Graduate School, Chungnam National University, Semiconductors and Circuits/System, Department of Electronics, Radio Science & Engineering, and Information Communications Engineering, 2015
Includes bibliographies
In English; summary in Korean
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