국가전거
주제명검색
전자책
Local anodic oxidation and tip-induced scratching using atomic force microscopy on compound semiconductors
표제/저자사항
Local anodic oxidation and tip-induced scratching using atomic force microscopy on compound semiconductors / Ahn, Jung Joon
발행사항
서울 : Graduate School Kwangwoon University, 2011
형태사항
주기사항
Thesis(M.A.) -- Graduate School Kwangwoon University, Department of Electronic Materials Engineering, 2012
분류기호
한국십진분류법-> 569.2
주제명
아토믹[atomic]
출처
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